ISO 13320
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The international standard ISO 13320 "Particle Size Analysis – Laser Diffraction Methods" describes the methods for the determination of particle size distribution via laser diffraction. In the following table, you will find the technical specifications required by ISO 13320 for the ANALYSETTE 22 NeXT. All laser diffraction instruments for particle size measurement can be compared worldwide based on this table.
Table of the technical specifications demanded according to ISO 13320:
Laser
| Specification | Micro / Nano |
| Type | Solid state diode |
| Wavelength | 520 nm (green) |
| Power | approximately 1 mW |
| Intensity stability (accepted level of fluctuation) | < 2 % |
| Beam shape | Gauß, phase-coupling |
| Polarization | linear polarized >100:1 |
| Typical lifetime | 10000 h |
Lens
| Specification | Micro / Nano |
| Focal length | 400 mm |
| Working distance | 360 mm |
| Fixed or requires changing | fixed |
Detector
| Specification | Micro / Nano |
| Number of elements | 51 / 60 (Nano) |
| Geometry (e.g. half or quarter rings, segments, etc.) | half rings and segments |
| Alignment automatic oder manual | automatic and manual |
| Detector elements calibrated | yes |
| Display of the normal detector signals for background measurements and their permissible limits | yes |
| Overload level for detector elements | 16Bit, 65536 |
Performance
| Specification | Micro / Nano |
| Repeatability within instrument | d50 < = 0.5 % |
| Instrument to instrument | d50 < = 3 % |
| Resolution and number of size classes | up to 110 |
| Lower detection limit for small amounts of small and large particles in size distributions (within measuring range) | 3 % |
| Indication of particles outside measuring range | lower limit cumulative |
Output
| Specification | Micro / Nano |
| Measuring range, overall and during each analysis | 0.5 - 1500 µm / 0.01 – 3800 µm (Nano) |
| Particle size class ranges, fixed or adjustable | up to 110 |
| Types of output, e.g. differential and cumulative distributions, values for certain particle sizes in percent and / or inverted, moment values, conversion in distribution models | for all types |
| Data storage, availability of background and sample measurement values | ASCII, Access, Excel, all values storable |
Sample Circuit
| Specification | Micro / Nano |
| Depth of the measuring plane in laser beam | 4 mm |
| Liquid pump rate | 3.5 l/min |
| Ultrasonic power and frequency | 50 W / 40 kHz |
| Volume of sample circuit | 150 - 500 ml |
| Materials of system in contact with particles and dispersion fluids | high-quality stainless steel 316L, PTFE, BK7 glass, Viton®, hoses made of LEZ SIL® |
| Maximum particle size which can be dispersed | 3800 µm |
| Maximum density of the sample (depending on particle size) | 14 g/cm³ |
Measurement
| Specification | Micro / Nano |
| Typical measuring time | 10 s |
| Minimum time between measurements | 2 min |
Analysis
| Specification | Micro / Nano |
| Calculation of model matrix | yes |
| Multiple scattering calculation | yes, internal |
| Type of optical models that can be applied | Mie, Fraunhofer |
| Indicative description of mathematical methods for example weighting, bounding, grading | Regularization |
Software
| Specification | Micro / Nano |
| Software | MaS control |
| Required computer | Standard Windows-PC, 4 GB RAM, at least Windows 10, USB port, monitor, keyboard, mouse |
Sales Consultant Particle Sizing
M.Sc. (Phys.) Maik Paluga
FRITSCH GmbH - Milling and Sizing
Industriestrasse 8
55743 Idar-Oberstein
55743 Idar-Oberstein
Phone +49 67 84 70 188
Mobile +49 151 40 48 38 41